61. Davis Metrology And Manufacturing Company / CMMS Calibration, service and repair of all brands and types of CMMs. Consultation on CMM, machine tools accuracy to resolve quality and manufacturing disputes. http://www.cmmdavis.com/

CONSULTING...SERVICE...CALIBRATION Of Coordinate Measuring Machines (CMM) Accuracy Verification of Machine Tools CONTACT INFO USED MACHINES PAGE CONSULTATION SERVICE ... CALIBRATION Let us solve your Manufacturing and Quality disputes Full documentation of results Repair Maintenance Laser Electronic levels Certify Accuracy of ANY CMM to NIST standards Preventative Maintenance Performed with Calibration Full accuracy check including positional, roll, pitch and yaw (pitch and yaw shown as straightness) Full printout of results Volumetric calculations DESIGN Custom machine solutions to your metrology needs Calibrations Davis is a company that specializes in all aspects of Coordinate Machine Measuring. When calibrating a CMM, we analyze and adjust to correct where practicable (don't just tell you what it is) all geometries of your CMM. Many CMM calibrators perform only linear or non-linear certifications of your scales, which are only one element in the overall accuracy of your CMM and usually is a very minor contributor to error. Others do some additional geometry check but very few, if any, perform a full geometric evaluation of your CMM. We do much more work in our calibrations than any other company that we have encountered but we know it is necessary to provide our customers with a true certification of the accuracy of their CMM. Dimensional correctness of your inspection results in one of the most important criteria that directly enters into the product quality that all companies are striving to attain today. Davis can provide you with the confidence that an inspection group

62. Edison ESI SCE metrology provides precision calibration of force, flow, pressure, time, frequency, vibration, dimensional, torque, mass, temperature, humidity and http://www.edisonmetrology.com/

63. Future Fab Intl. Section 7 Introduction metrology Failure Analysis Future Fab Intl. Volume . The metrology/Failure Analysis section of Future Fab International usually http://www.future-fab.com/solutions.asp?sID=216

64. Surface Metrology Laboratory - Washburn Shops 243 - Welcome Surface metrology is the study of surface geometry, also called surface texture or surface roughness. The approach is to measure and analyze the surface http://www.me.wpi.edu/Research/SurfMet/

Surface Metrology Laboratory - Washburn Shops 243 Become A Lab Partner About Us Equipment and Software ... Seminar Welcome Read the recent Boston Globe article on the Surface Metrology Lab. Surface Metrology is the study of surface geometry, also called surface texture or surface roughness. The approach is to measure and analyze the surface texture in order to be able to understand how the texture is influenced by its history, (e.g., manufacture, wear, fracture) and how it influences its behavior (e.g., adhesion, gloss, friction). Quantitatively the objective in surface metrology is to be able to use texture measurements and analysis to differentiate and correlate surfaces with different behavior or histories. These differentiations and correlations support product and process design, quality assurance, in engineering. Surface metrology can also be used to support scientific discoveries in a variety of fields including anthropology, archeology, geography, geology, and biochemistry. /** User variables **/ var speed = 10; // Lower numbers yield a faster transition - must be 2 or higher var delay = 2; // Number of seconds between each slide transition var myPhotos = new Array("http://www.me.wpi.edu/Images/CMS/ME-MFE-SurfMet/001_rdax_300x225.jpg", "http://www.me.wpi.edu/Images/CMS/ME-MFE-SurfMet/005_rdax_300x225.jpg", "http://www.me.wpi.edu/Images/CMS/ME-MFE-SurfMet/007_rdax_300x225.jpg", "http://www.me.wpi.edu/Images/CMS/ME-MFE-SurfMet/016_rdax_300x225.jpg", "http://www.me.wpi.edu/Images/CMS/ME-MFE-SurfMet/021_rdax_300x225.jpg", "http://www.me.wpi.edu/Images/CMS/ME-MFE-SurfMet/080_rdax_300x225.jpg"); var pf = new photofader("pf","photoholder",myPhotos);

65. Consolidated Metrology Services Inc. Provides scientific evidence of improving machine tool parts quality, supporting the benefits of metrology and calibration. http://machtoolcal.com/

C onsolidated M etrology S ervices, I nc. Machine Tool Calibration and Repair Home Our Services The Need for Calibration Benefits of Machine Assessment ... Contact Information About US Corporate Structure CMSI is a locally owned business operated by Cecil W. Dickson who has over eighteen years of experience in the machine tool measurement and repair field. Cecil’s expertise in the field of machine tool metrology is known worldwide. Having worked for Caterpillar in their Technical Services Division, he provided several business units and suppliers with machine metrology services. Cecil has traveled across the globe giving seminars, and presentations on the benefits of machine tool calibration. The focus of this effort has been and continues to be utilizing the ANSI/ASME B5.54 and B5.57 standard. Experience Cecil has the ability to provide superior measurement services, and due to his mechanical background he is able to provide solutions to your problem as well. This can range from suggestions that your maintenance department can perform to having CMSI do the repairs for you. There are companies that provide measurement services and some that provide repair services.

66. Metrology - Microelectronics - Metrology Tools From the world leader in analytical instruments, a suite of metrology tools for production development and process control, ESD and LatchUp simulators to http://www.thermo.com/com/cda/landingpage/0,10255,392,00.html

About Us Careers Locations Investors ... Contact Us Welcome Guest from United States Sign In Change Country Items Search: Semiconductor and Microelectronics Thermo Scientific FAB Direct Program Whether you are operating one shift per day or 24/7, Thermo Scientific has just the right combination of services to meet your operation and budgetary requirements. Our Thermo Scientific Direct program includes local, customized service options to help you manage the life of your temperature measurement control equipment to reduce your downtime risk and costs. Applications FT-IR Metrology Application Notes Analysis of Semiconductor Grade Mineral Acids by ICP-MS Determination of Semiconductor Grade TMAH Developer Determination by ICP-MS Use of the Semi-Quantitative Calibration Mode for Rapid Sample Screening in ICP-MS ... Fast Parallel X-ray Photoelectron Imaging Metrology Tools From the world leader in analytical instruments, a suite of

67. East Coast Metrology - Measurement Consulting And Contract Services East Coast metrology, LLC is a select group of professionals dedicated to the advancement of our customers product and quality through the use of innovative http://www.eastcoastmetrology.com/

East Coast Metrology is a select group of professionals dedicated to the advancement of our customers product and quality through the use of innovative metrology solutions. By providing on-site measurement services, engineers at East Coast Metrology have positioned the company as the leading contract measurement service group in large-scale, high-precision measurement for a wide variety of manufacturing industries including automotive, government and commercial nuclear power, hydro power, antenna systems, research and general manufacturing. See us at EASTEC May 22-24 West Springfield, MA Click here to register for FREE!

68. Metrology | Metrology News, Research And Current Events Brightsurf metrology news and metrology current events, research and discoveries. http://www.brightsurf.com/search/r-a/Metrology/1/Metrology_news.html

Brightsurf Science News The latest science news and science current events. Top Science News The top science news articles and science current events news from the past week. Add Brightsurf Science News to your Web Site Science Resources Earth Science Space Science Life Science Fields of Scientific Study ... Nanotechnology Articles Science RSS News Feeds Earth, Life and Space Science RSS News Feeds. Earth Science RSS News Space Science RSS News Life Science RSS News Fields of Scientific Study RSS ... Next Sort By: Page Views Date Mastering chemical data The Virtual Institute for Chemometrics and Industrial Metrology (VICIM) funded by the European Union has taken up operations. This European network of excellence in chemometrics and metrology enables industrial clients to face the challenges in the analysis of today`s complex chemical measurement... view more Silicon chips for optical quantum technologies A team of physicists and engineers has demonstrated exquisite control of single particles of light - photons - on a silicon chip to make a major advance towards the long sought after goal of a super-powerful quantum computer. view more LGC, the UK`s leading independent analytical laboratory providing chemical, biochemical and DNA analysis, has purchased a new Bruker Daltonics APEX III 47e Fourier Transform Mass Spectrometer (FTMS). This instrument, with its exceptionally high mass accuracy and resolution, will be used to...

69. Dimensional Metrology, Laser Interferometry, Nanotechnology, American Society Fo The American Society for Precision Engineering (ASPE) focuses on many areas that are important in the research, design, development, manufacture and http://www.aspe.net/

The American Society for Precision Engineering (ASPE) focuses on many areas that are important in the research, design, development, manufacture and measurement of high accuracy components and systems such as precision controls, metrology, interferometry, materials, materials processing, nanotechnology, optical fabrication, precision optics, precision replication, scanning microscopes, semiconductor processing, standards and ultra-precision machining. The precision engineering toolbox includes design methodology, error budgeting, uncertainity analysis, metrology, calibration/error compensation, precision controls and actuators and sensors. ASPE provides a forum to encourage and enable the open exchange of ideas and information between industry, academia and government laboratories by providing annual and topical meetings, continuing professional education and training, publications dedicated to encouraging, sharing and preserving new advances in precision engineering principles and opportunities for direct contact with expert practitioners in the field. Precision Mechanical Design and Mechatronics ... Equipment ASPE Spring Topical Meeting April 7-8, 2008

70. Metrology Links - JLW Instruments Metrology Concepts JLW Instruments metrology Concepts accepts Visa for the purchase and calibration of force gauges, pressure JLW Instruments metrology Concepts accepts http://www.jlwinstruments.com/Metrologylinks.htm

14 North Peoria St. Suite B-101 Chicago, IL 60607-2755 Voice (312) 666-0595 Fax (312) 733-0009 Calibration Capabilities Instrument Repairs RMA Online Technical Support ... Metrology Links Useful Metrology Links http://www.a2la.net NIST http://www.nist.gov NVLAP http://ts.nist.gov ISO http://www.iso.ch/iso ANSI http://www.ansi.org NAPT http://www.proficiency.org ASTM http://www.astm.org eCalibration http://www.eCalibration.com DOX Calibration Granite Surface Plate Calibration and Resurfacing service http://www.doxcalibration.com Serebella Open Diectory Project http://www.Serebella.com Gauge Guide A gauge resource directory site. http://www.gaugeguide.com ZHealth Publishing ZHealth Publishing Interventional PLC Center.com Buy our surplus controls or we'll repair yours, 1 year warranty, sales and service. http://www.plccenter.com Looking for refurbished instruments? Tell us what you need... Looking for a new system? We carry the only the best! Click here to see... How are we doing? Fill out the Survey and let us know... Have you filled out a profile?

71. Large Area Metrology Systems HORIBA Jobin Yvon ellipsometers combine two key elements phase modulation and an entirely numerical data acquisition and processing system. http://www.jobinyvon.com/Large Area Metrology

HORIBA Worldwide Home Company Profile Employment ... International Links English US English UK Italiano Deutsch Applications Measurement Types Product List Location: Products Thin Film Thin Film Metrology > Large Area Metrology Systems Large Area Metrology Platform for Display Industry Flat panel metrology systems integrate a spectroscopic ellipsometer and DUV spectroscopic reflectometer. They allow the accurate and fast characterization of film thickness, optical constants and reflectivity of patterned as small as 10 microns and multilayer materials. FF-1000 Combined Spectroscopic Ellipsometer / Reflectometer DIGISCREEN Automated UV-VIS Spectroscopic Reflectometer more information more information Request Info Request Info var gaJsHost = (("https:" == document.location.protocol) ? "https://ssl." : "http://www."); document.write(unescape("%3Cscript src='" + gaJsHost + "google-analytics.com/ga.js' type='text/javascript'%3E%3C/script%3E"));

72. Plasma Process Metrology Plasma Process metrology. Goal Provide advanced measurement techniques, data, and models needed to characterize plasma etching and deposition processes http://www.cstl.nist.gov/div836/836.04/Plasma/index.html

Process Sensing Group Process Measurements Division Post-Doctoral Opportunities Publications Created: January 2003 Plasma Process Metrology Goal: Provide advanced measurement techniques, data, and models needed to characterize plasma etching and deposition processes important to the semiconductor industry, enabling continued progress in model-based reactor design, process development, and process control. Objective: Provide advanced measurement techniques, data, and models needed to characterize plasma processes used by the semiconductor industry, enabling continued progress in model-based reactor design and process control. Scientific Staff: Mark A. Sobolewski Kristen L. Steffens Michael J. Carrier NIST Internal Collaborations: Eric Benck (Physics Lab) Karen Siegrist (Physics Lab) James Olthoff (EEEL) Yicheng Wang (EEEL) Research Areas Electrical Characteristics of Plasmas 2-D Optical Diagnostics in Plasmas - densities, emission, and temperatures

73. Welcome To Precision Metrology Inspection, LLC The Home of PMI on the web, Providing Precision metrology services in an A2LA Accredited lab. http://www.pminspect.com/

10,000 sq. ft. state of the art facility Documented Quality System NIST traceability and inspection per ANSI Y14.5M Experienced technicians Environmentally controlled laboratory Centrally located/ Globally capable Advanced Research Center Direct Computer Controlled (DCC) CMM's Dimensional Measurement Profile Measurement Depth Mapping Point Clouds using laser and scanning probe technology Precision Metrology Inspection has been in the manufacturing/inspection business for over 45 years. Combined with Bobier Tool Supply's 60 years of experience we bring a full compliment of production inspection knowledge and solutions to your quality process. Our understanding of the manufacturing process provides information beyond that of typical inspection facilities. Our NEW state of the art 45'X40' laboratory with complete climate control was awarded ISO 17025 version 2005 certification from A2LA! Exceptional uncertainty numbers: Guaranteed Temperature stability of +/-1°F (0.6° C)

74. Astro Metrology The goal of the research currently being conducted by the members of the Astrometrology Group is to apply physics techniques to various problems in http://www.physics.umd.edu/rgroups/astrometro.html

The goal of the research currently being conducted by the members of the Astro-Metrology Group is to apply physics techniques to various problems in astrophysics, astrometry, interferometry, and related areas. In particular, they adapt new concepts to the measurement of astronomical systems through design and production of novel instruments and use of advanced image processing techniques. Resources include access to data obtained by the Hubble Space Telescope and Ground-based Adaptive Opitics Systems. Personnel Douglas Currie, Professor Emeritus Ed Shaya, Visiting Research Associate Kenneth Kissell, Senior Research Associate Research Areas: Imaging in the Eagle Nebula (M16) Hubble Space Telescope - Eta Carinae Hubble Space Telescope - Uranus Satellites/Rings Adaptive Optics - Image Processing ... Lageos - Spin Axis Motion Change Detection Interferometry Chaos - Sunspot Prediction LAGEOS-I SPIN AXIS MONITORING PROGRAM Research Group Website: http://www.physics.umd.edu/rgroups/am/

75. Measurement Analysis / Metrology Freeware From Integrated Sciences Group Freeware for estimating measurement uncertainty, calibration intervals and assessing measurement decision risk. http://www.isgmax.com/freeware.htm

State-of-the-Art Measurement Analysis Software, Training and Consulting Services Celebrating 20 YEARS of Excellence and Innovation 1987-2007 internet isgmax.com Free Analytical Metrology Software Tools Our freeware applications contain key benchmark methods developed by ISG. We believe that these free measurement uncertainty analysis, decision risk analysis and calibration interval analysis applications will help promote the use of valid and effective methods and techniques. Unlike other analytical metrology freeware, our freeware applications are actively updated and supported. We hope you find them both useful and informative. If you have any questions or comments about these tools, please call us at or e-mail us at tech@isgmax.com Uncertainty Analysis Uncertainty Sidekick contains state-of-the-art analysis methods and techniques designed to guide you through the process of developing uncertainty estimates for direct measurement scenarios. Type B Uncertainty Calculator is a stand-alone tool that organizes our experience and knowledge in such a way that a Type B uncertainty estimate is obtained in a straightforward and unambiguous manner Risk Analysis RiskGuard determines test / calibration guardbands that correspond to a specified maximum allowable false accept risk.

76. FilmTek™ Optical Metrology Systems Come In A Variety Of Configurations, And Dep FilmTek™ metrology tools from Scientific Computing International (SCI) come in a variety of configurations, and depending on the model can measure http://www.sci-soft.com/Metrology.htm

Home Customer Support Download Center Literature ... Company Metrology Products Software Products Applications Contact Us FilmTek 4000EM-DUV ... FilmTek CD Metrology Products FilmTek™ spectrophotometry-based metrology systems from Scientific Computing International (SCI) have long set the standards for characterization of thin films. Now — our FilmTek™ 4000 Series "raises the bar" by delivering 100 times the resolution of the best non-contact method, and 10 times the resolution of the best prism coupler contact systems. It's the result of our patented DPSD™ (Differential Power Spectral Density) technique. And it's the latest example of how SCI is leading the thin film metrology field by raising performance to a new level — while offering systems that are truly affordable for virtually every application. Easy-to-Use Computer Power Affordable Systems for Virtually Every Budget FilmTek™ 1000 is the most affordable system for measuring reflection at normal incidence in the visible to NIR. FilmTek™ 1500 adds transmission mode measurements to reflection.

77. Metrology And Calibration Service Laboratories The everexpanding Lockheed-Martin Mission Services network of metrology Service Laboratories provides service and a one-stop shop for a wide variety of http://www.lockheedmartin.com/products/metrology_service_laboratories/index.html

[Jump to the main content of this page] Home Contact Us Search: Advanced Search About Us At a Glance Biographies ... State-of-the-Art Resources LMT Last Trade: Daily Change: Daily (%): Daily Volume: Exchange: Home Products Metrology and Calibration Service Laboratories Metrology and Calibration Service Laboratories DESCRIPTION: The ever expanding Lockheed Martin Mission Services network of Metrology Laboratories provides world class calibration in an integrated solution for a wide variety of test and measurement equipment. These services include: calibration, repair and on-site servicing. Equipment pick-up and delivery is available in many local areas as well as overnight shipping and two day turn around. Lead by an industry recognized management team, we offer quality coupled with the dependability of Lockheed Martin. All Calibrations are traceable to the National Institute of Standards and Technology, Intrinsic Standards, or Industry Accepted Standards. Features and Benefits ISO Registered Accreditation Expert engineering staff State-of-the-Art equipment and resources Commercial service and fast turnaround Comprehensive solutions Quality and audit support Competitive costs Periodic service needs assessments Repair Services LMMS Metrology Service Laboratories by Region Call Toll Free: 877.847.5732 email:

78. Job Search Results For Boston.com Jobs Work hard to be the best? Choose Hexagon metrology Challenging projects and an exhilarating intellectual atmosphere await you at H more http://boston.monster.com/search.aspx?q=Hexagon Metrology&lid=452&lid=366&lid=68

79. Quantum Interference And Frequency Metrology Frequency metrology by use of Quantum Interference, N. Ph. Georgiades, E. S. Polzik and H. J. Kimble, Opt. Lett. 21, 1688, (1996). (Abstract) http://www.its.caltech.edu/~qoptics/QIHome/QIHome.html

home research people publications ... beer fines Quantum Optics Group Norman Bridge Laboratory of Physics California Institute of Technology N. Ph. Georgiades, E.S.Polzik and H. J. Kimble INTRODUCTION Our group has extensively studied both theoretically as well as experimentally the subject of Quantum Interference (QI) in multiphoton atomic processes as well as its possible applications to frequency metrology and other commercial applications. The origin of quantum interference in multiphoton excitations in the presence of multiple lasers arises due to the presence of multiple excitation pathways, the amplitudes of which coherently interfere to result in a fringe pattern of the excited state population (see logo cartoon above). Viewed in a different way, the atom behaves as a quantum nonlinear mixer (QNM) with demodulation capabilities that extend to 100's of THz. Our results are discussed in several papers, QNM is pending a patent, a computerized search algorithm for optimizing a particular experimental realization has been developed and an interactive quantum interference calculator (QuInC) based on our theory has been implemented and presented here. Quantum Interference Calculator: QuInC (click on me) Frequency Metrology: MetQuIn (click on me) Patent: U.S. Patent Application S/N 08/799,169

80. PTC Metrology Temperature Calibration Laboratory, Durometer Calibration And Cert PTC metrology is accredited by A2LA to ISO/IEC 17025 and ANSI/NCSL Z5401. Our certificate number 1896.01 from A2LA covers calibration of durometers http://www.ptcmetrology.com/

Home I PTC Products I Contact I Site Map I Shop PTC Online I Downloads PTC Metrology Calibration Laboratory Specializing in Temperature, Pressure, RH and Durometers PTC Metrology is accredited by A2LA to ISO/IEC 17025 and ANSI/NCSL Z540-1. Our certificate number 1896.01 from A2LA covers calibration of durometers , thermometers, hygrometers, pressure gauges, and loggers, and infrared surface thermometers. In keeping with the worldwide demand for accredited calibrations, PTC Metrology has chosen A2LA as our accrediting body. Click on the link to view our scope of our accreditation . The ILAC (International Laboratory Accreditation Cooperation) arrangement provides a technical basis to international trade by promoting global member and customer confidence and acceptance of accredited laboratory data. Effective January 1st. 2006, A2LA accepts traceability via the use of calibration laboratories accredited by an AB that is signatory to the APLAC, EA, IAAC or ILAC MRA. Currently in the United States, only A2LA, International Accreditation Services (IAS) and the National Voluntary Laboratory Accreditation Program (NVLAP) meet the A2LA Traceability Policy. ( see http://www.a2la.org/policies/Traceability_Policy.pdf.) What is Accreditation?

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