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Metrology: more books (100)

Microwave Circuit Theory: And Foundations of Microwave Metrology (IEEE Electrical Measurement Series) by Glenn F. Engen, 1992-12-01
Reactor Dosimetry: Radiation Metrology and Assessment (Astm Special Technical Publication// Stp) by Editor(s): John G. Williams; David W.Vehar; Frank H. Ruddy; David M. Gilliam, 2001-02-01
The Origins of the Old Rus' Weights and Monetary Systems: Two Studies in Western Eurasian Metrology and Numismatics in the Seventh to Eleventh Centuries (Harvard Series in Ukranian Studies) by Omeljan Pritsak, 1998-08-01
Physical Acoustics and Metrology of Fluids (Series in Measurement Science and Technology) by Martin Trusler, 1991-01-01
Frequency Standards and Metrology: Proceedings of the 7th Symposium, Asilomar Conference Grounds, Pacific Grove, CA, USA, 5-11 October 2008
First European Conference on Optics Applied to Metrology, October 26-28, 1977, Strasbourg (France) (Proceedings of the Society of Photo-optical Instrumentation Engineers ; v. 136)
Nuclear Data Guide for Reactor Neutron Metrology by J.H. Baard, W.L. Zijp, et all 1989-11-30
Optical Metrology: Proceedings of a Conference Held 18-19 July, 1999, Denver, Colorado (Critical Reviews of Optical Science and Technology)
Three-Dimensional Imaging, Optical Metrology, and Inspection IV: 2-3 November, 1998, Boston, Massachusetts (Proceedings of Spie--the International Society for Optical Engineering, V. 3520.) (No. 4)
Optical Metrology In Production Engineering (Proceedings of Spie)
Material Culture of the Chumash Interaction Sphere: Manufacturing Processes, Metrology and Trade by Travis Hudson, Thomas C. Blackburn, 1987-12
Laser Dimensional Metrology: Recent Advances for Industrial Application : Proceedings 5-7 October 1993 Brighton United Kingdom/Volume 2088 (SPIE proceedings series) by M. Downs, 1994-10
Selected Papers on Optical Shop Metrology (SPIE Milestone Series Vol. MS18) (S.P.I.E. Milestone Series) by Daniel Malacara-Hernandez, 1990-09-01
Speckle Metrology (Optical Science and Engineering) by Sirohi, 1993-05-20

lists with details

Exact Metrology
Exact metrology is the North American leader in metrology services and products. We carry only the best metrology products that each of the best companies
http://www.exactmetrology.com/
Fox Valley Metrology
Fox Valley metrology, Full metrology Lab Calibration Services.
http://www.foxvalleymetrology.com/

Extractions: If the web page header does not load, click here FULL SERVICE METROLOGY LAB To view our accreditations, click here We are a full service calibration lab with three offices that are fully staffed to handle all of your in-house and field service needs. We are proud to be ISO 9001 Registered and ISO / IEC 17025 Accredited. All of our offices use similar standards, equipment, computers, software and procedures to ensure the highest quality of service to our customers. Our professional technicians are eager to perform calibration services either in our lab or at your facility to save you money and reduce down-time. To request a quote or schedule an on-site visit contact: Mark Toll at Mark@FoxValleyMetrology.com (Oshkosh, WI area or Minneapolis, MN area) Caleb Pohlman at Caleb.Pohlman@FoxValleyMetrology.com (St. Louis, MO area) SPRING SPECIALS FREE ONLINE CALIBRATION MANAGEMENT Go paperless and don't go back! Fox Valley Metrology remains the innovator of "Paperless Certifications" with new features added monthly. Certifications are now downloadable in Adobe's Portable Document Format (PDF) and have added new search engines for enhanced customer ease.
NIST: Atomic Physics Div. - Quantum Processes And Metrology Group
The Quantum Processes and metrology Group develops theory and models of atomic, molecular, and condensed matter processes, and experimental metrology for
http://physics.nist.gov/Divisions/Div842/Gp2/index.html

Extractions: The Quantum Processes and Metrology Group develops theory and models of atomic, molecular, and condensed matter processes, and experimental metrology for quantum processes in nanoscale systems. The group is interested in the dynamic and static properties of these systems and how these systems interact with optical and magnetic fields. The goals of these fundamental studies are directed towards improved physical measurements, enhanced nanoscale measurement, and quantum coherent devices. Group Staff Atomic Physics Division home page Physics Laboratory home page NIST home page Projects: Cold Collisions: numerical and analytic quantum scattering calculations of atomic collision properties below 1 mK. Photoassociation Spectroscopy: calculation and analysis of experimental data on high-resolution photoassociation spectra of cold trapped atoms.
Dorsey Metrology International
Indicating Devices Dial indicators, Digital indicators, Test indicators, Signal indicators, Digital readouts, LVDTs, Direct Reading Gages Height stands,
http://www.dorseymetrology.com/

Extractions: PROUDLY MADE IN USA Indicating Devices : Dial indicators, Digital indicators, Test indicators, Signal indicators, Digital readouts, LVDTs Direct Reading Gages : Height stands, Surface finish, Test indicator stands, Squareness, Micrometers, Calipers, Depth, Countersink /counter bore, Comparator stands ID/OD Gages : Rocking style bore, Pistol grip bore, Retractable bore, Pitch diameter, Groove, ID/OD fixture,s Ball checking, Snap Large Diameter Gages : Inner and outer diameter, Depth, Height, Retractable, Setmasters, Concentricity, Taper Optical Comparators : Benchtop models, Floor models, Workstage fixturing, Precision coordinate staging, Special design and build Parts
Northeast Metrology Inc.
elcome to Northeast metrology Inc., a service business based in Western Massachusetts whose customers include a great variety and size industries from large
http://www.nemetrology.com/

Extractions: elcome to Northeast Metrology Inc., a service business based in Western Massachusetts whose customers include a great variety and size industries from large aerospace corporations to small machine shops, and, also, other calibration and repair facilities. Here at Northeast Metrology we boast a skilled and dedicated staff of employees who have made us the fastest growing dimensional laboratory in New England. In 1985 Bob's Gage Repair was incorporated and in 1989 its name was changed to Northeast Metrology Inc. to reflect the broader scope of the services now offered. Our customers supported this change by helping us continue to grow. By 1990 Northeast Metrology had outgrown its initial location and moved to its present facility in the East Longmeadow Industrial Park.
Metrology: The Forgotten Science
... The Key to Ancient Architecture The Mapping of the Earth A History of Measures The Deluge as Metaphor Gyges and Homer The Persian Wars
http://www.metrum.org/
NIST Standard Reference Database 136: International Comparisons Database (ICDB)
The International Comparisons Database (ICDB) serves the U.S. and the InterAmerican System of metrology (SIM) with information based on Appendices B
http://icdb.nist.gov/

Extractions: The International Comparisons Database (ICDB) serves the U.S. and the Inter-American System of Metrology (SIM) with information based on Appendices B (International Comparisons), C (Calibration and Measurement Capabilities) and D (List of Participating Countries) of the Comité International des Poids et Mesures (CIPM) Mutual Recognition Arrangement (MRA) . The official source of the data is The BIPM key comparison database . The ICDB provides access to results of comparisons of measurements and standards organized by the consultative committees of the CIPM and the Regional Metrology Organizations
Laser Distance Sensors, Torque And LVDT Sensors From MRC
expertise to solve critical measurement challenges with laser distance sensors, torque load sensors and optical profile measurement systems.
http://www.metrologyresource.com/

Extractions: For industrial and scientific sensor users, Metrology Resource Co. has the expertise to solve critical measurement challenges with laser distance sensors torque load sensors and optical profile measurement systems . Their experienced engineers manage projects in the United States, Canada and the United Kingdom. MRC distance measuring products include long-distance laser rangefinders and highly accurate CMOS triangulation sensors . Through a partnership with BMT , the company applies white light interferometry principles to profile surfaces . We look forward to working with you! Contact us Metrology Resource Co. distributes laser distance sensors Long-range distance sensors High-accuracy sensors Torque load sensors Profile gaging ... Affiliations
ODA Measurement Standards Division Introduction To The Metrology Program
ODA Measurement Standards Division Introduction to the metrology program.
http://www.oregon.gov/ODA/MSD/metrology_intro.shtml

Extractions: Introduction to the metrology program Introduction More information on metrology Introduction As part of the Measurement Standards Division, the Oregon State Metrology Laboratory maintains the primary and "working" standards of mass, volume, and length for the State of Oregon. These standards are directly traceable to the national standards maintained by the US Department of Commerce, National Institute of Standards and Technology (NIST).
AMS
Our singleminded focus is on solving metrology problems in partnership with our customers, continuously improving your yield.
http://www.advancedmetrologysystems.com/
Weights And MeasuresNIST Laboratory Metrology: Home Page
National Institute of Standards and Technology metrology Resources for State and Commercial Laboratories.
http://www.nist.gov/labmetrology

Extractions: 105-3, Graduated Neck-Type Volumetric Test Measures and Provers (2004 Draft for Review) 105-4, Liquefied Petroleum Gas Type Provers 105-8 Weight Cart - Developmental Materials **We are reviewing the 105-series handbooks during 2002. Please download and use the Comment Form (in MS Word) to submit comments. Be sure to provide alternative wording when you suggest changes to a document. Publications
KLA-Tencor-Prometrix | Service | Sales | Parts | Refurbished Systems -- Metrolog
metrology Equipment sales and service including Refurbished systems, Spare Parts, Consumables, OnSite Field Engineering, and In-House Repair/Calibration
http://www.metrologyequipmentservices.com/

Extractions: M etrology E quipment S ervices, LLC - Metrology Equipment sales and service including Refurbished systems, Spare Parts, Consumables, On-Site Field Engineering, and In-House Repair/Calibration Services for KLA-Tencor-Prometrix advanced semiconductor measuring systems. For nearly 10 years, MES has provided products and services to the semiconductor, aerospace and medical industries. Our team is dedicated to discovering, developing and implementing the right solutions for your university or company. We're currently utilizing our calibrated HRP-200 system to provide sample measurement services. You can send us the samples to be measured and we'll provide you with a detailed print-out of the measurement data. To request a quote or more information, please contact us with your measurement criteria. We buy and sell high quality refurbished wafer measurement tools. All our refurbished systems come with a parts and labor warranty. For customers located in the Bay Area, installation is included with the purchase. If shipment is needed, we provide free crating for select systems.
Evitherm - European Virtual Institute For Thermal Metrology
www.evitherm.org/ 2k - metrologyPhD research engineer in time and frequency metrology, featuring phase noise measurements, and the spectral domain for microwave, based in Besançon, France.
http://www.evitherm.org/
Semiconductor International Metrology Report
Jan 23, 2008 Rudolph Technologies provides fullfab metrology solutions with its ellipsometry and PULSE Technology tools for thin-film measurements used
http://www.semiconductor.net/eNewsletter/CA6525117/3576.html

Extractions: January 23, 2008 IN THIS EDITION NEWS Rudolph Adds 3-D Bump Inspection From RVSI Applied Materials Announces Work Reduction Metryx, IMEC to Jointly Develop Sub-32 nm Metrology Nanometrics Reduces Workforce by 7% ... Credence to Cut 30% of Workforce EDITOR'S PICKS Webcast: Highlights of the 2007 ITRS Executive Outlook: Driving Productivity, CoO in 2008 2008 Economic Forecast: Fairly Unpredictable Engineering Microscopes Zoom In on Defects PRODUCTS Wafer Bump Inspection System Wafer Inspection Tool UPCOMING EVENTS Dear Subscriber, AEBEditor@aol.com Advertisement Process Control Metrology Rudolph Technologies provides full-fab metrology solutions with its ellipsometry and PULSE Technology tools for thin-film measurements used in all stages of semiconductor manufacturing, from advanced gate formation to copper interconnect structures. In a move that adds a 3-D bumped-wafer inspection system to its product portfolio, Rudolph Technologies Inc. (Flanders, N.J.) acquired the intellectual property and other selected assets from privately held RVSI Inspection LLC (Hauppauge, N.Y.). This, combined with Rudolph's December 2007 acquisition of the probe card test and analysis business of Applied Precision LLC (Issaquah, Wash.), is intended to bolster Rudolph's position in the back-end inspection tool market. More Applied Materials Announces Work Reduction Applied Materials Inc. (Santa Clara, Calif.) will reduce its global workforce by 1000 positions, or ~7%, through a combination of job elimination and attrition. The plan primarily affects Applied's semiconductor equipment and services businesses and related support organizations. The plan is expected to result in annualized savings of ~$150M from fiscal 2007 spending levels.
Home - Brown & Sharpe - Brown & Sharpe
Brown Sharpe is a brand of Hexagon metrology, Inc. We offer the most complete line of dimensional metrology products anywhere in the world.
http://www.brownandsharpe.com/
Metrology : Tektronix
metrology ensures calibrated instruments deliver accurate results. Choose Tektronix as your provider and get the benefit of an experienced metrology staff
http://www.tek.com/service/metrology/

Extractions: Skip navigation Tektronix Metrology ensures that your calibrated instruments deliver accurate results with provable validity. The mission of metrology is to maintain measurement standards, to develop effective new methods, and to ensure that measurements are accepted uniformly around the world. Why calibrate? Your instruments need to be calibrated against known standards so their results can be trusted to have a universally accepted meaning. Metrology is the science that supports this trustâin both the "meaning" and the measurements: Without metrology and its standards, acceptance of products and measurements between nations and customers would be significantly more difficult. At Tektronix, metrology professionals guide calibration policies and procedures at accredited calibration facilities around the world. When you choose Tektronix as your service provider, you get the benefit of an experienced metrology staff plus seasoned technicians applying deep product-specific knowledge. The result?
NIST Laboratory Metrology: Laboratory Metrology Training & Schedule
A number of laboratory metrology seminars are offered by the NIST Weights and Measures Laboratory metrology Group. Course description , the current schedule
http://ts.nist.gov/WeightsAndMeasures/Metrology/TRAIN503.cfm

Extractions: A number of laboratory metrology seminars are offered by the NIST Weights and Measures Laboratory Metrology Group. Course description , the current schedule , and a sign-up form to be returned by e-mail, mail, or facsimile are provided here. The duration of all courses (unless otherwise noted) is one week, with the exception of the Basic Mass, Length, and Volume seminar for states, which is two weeks. The courses are: Basic Mass, Length, Volume - for State legal metrologists; Gaithersburg, MD 20899 Cost There is no charge for State participation in any of the laboratory metrology seminars coordinated by the Weights and Measures Division (WMD). The WMD program is funded to provide support to the States (only) to ensure uniformity in legal metrology throughout the United States. The charge for industry or foreign government participation in 2008 is $1295 per one-week course (fees and details yet to be determined for 2009 and following) to cover the cost of seminar materials and additional staff. This fee does not cover the cost for hotel, transportation, lunches, or breaks.
World Metrology Day: May 20
The Metre Convention was signed on 20 May 1875, a date now celebrated as World metrology Day. The Convention created the International Bureau of Weights and
http://www.worldmetrologyday.com/

Extractions: The Metre Convention was signed on 20 May 1875, a date now celebrated as World Metrology Day. The Convention created the International Bureau of Weights and Measures ( BIPM ) and set the framework for global collaboration in the science of measurement and in its industrial, commercial and societal application. The original aim of the Metre Convention the world-wide uniformity of measurement remains as important today, in 2007, as it was in 1875. The CIPM MRA emphasizes the importance of traceability to the units of the International System of Units ( SI ) and their applicability to all fields of science and technology. The BIPM is responsible for the SI, which is continuously being adapted to the needs of users, and modified as a result of technical progress. It is, therefore, a pleasure to announce, on World Metrology Day 2006, the publication of the 8th edition of the SI brochure . This replaces the 1998 edition and provides the most up-to-date survey of the decisions made by the CGPM and by the CIPM concerning the units. The brochure is available on the BIPM website and is also being made available to the metrology community, world-wide. For the first time, the main brochure is complemented by a short, easy reference
NIST - Fluid Metrology Group
Fluid metrology Group. Michael R. Moldover, Leader and NIST Fellow Process Measurements Division, 836.02 What s happening in The Fluid metrology Group
http://properties.nist.gov/fluidsci/
Indiana State Department Of Health
The metrology Laboratory calibrates and/or tolerance tests standards of mass, length, time, and volume. All measurement results are NIST traceable.
http://www.in.gov/isdh/regsvcs/wtmsr/metrology.html

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